Ion-Induced Charge-Collection Transients in p-Channel AlGaSb/InGaSb Heterojunction Field-Effect Transistors

Ion-induced, time-resolved charge-collection measurements for p-channel AlGaSb/InGaSb field-effect transistors are reported for a range of gate and drain bias conditions. The transient response reveals two distinct contributions: a faster initial response (<;1 ns) followed by a slower, >10 ns, relaxation. The slower contribution depends sensitively on the applied gate bias, is suppressed when the gate is made more positive toward depletion, and is identified with an enhanced source-drain current in which more charge is collected than is deposited by the ion. A model consistent with the experimental measurements suggests that the dynamics of the enhancement processes are associated with the trapping and detrapping dynamics of electrons in the AlGaSb barrier materials.