• DocumentCode
    439098
  • Title

    Optimization of thin film growth using multiscale process systems

  • Author

    Varshney, Amit ; Armaou, Antonios

  • Author_Institution
    Dept. of Chem. Eng., Pennsylvania State Univ., University Park, PA, USA
  • fYear
    2005
  • fDate
    8-10 June 2005
  • Firstpage
    2559
  • Abstract
    In this work we consider optimization problems for transport-reaction processes, when the cost function and/or equality constraints necessitate the consideration of phenomena that occur over widely disparate length scales. Initially, we develop multiscale process models that link continuum conservation laws with microscopic scale simulators. Subsequently, we combine nonlinear order reduction techniques for dissipative partial-differential equation systems with adaptive tabulation methods for microscopic simulators to reduce the computational requirements of the process description. The optimization problem is subsequently solved using standard search algorithms. The proposed method is applied to a representative thin film deposition process, where we compute optimal surface temperature profiles that simultaneously maximize deposition-rate uniformity (macroscale objective) and minimize surface roughness (microscale objective) across the film surface.
  • Keywords
    coating techniques; liquid phase deposition; optimisation; partial differential equations; process control; reduced order systems; search problems; surface roughness; thin films; transport processes; vapour deposition; deposition-rate uniformity; microscopic simulator; multiscale process system; nonlinear order reduction technique; optimization; partial-differential equation system; search algorithm; surface roughness; thin film deposition process; thin film growth; transport-reaction process; Adaptive systems; Computational modeling; Constraint optimization; Cost function; Microscopy; Nonlinear equations; Rough surfaces; Sputtering; Surface roughness; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2005. Proceedings of the 2005
  • ISSN
    0743-1619
  • Print_ISBN
    0-7803-9098-9
  • Electronic_ISBN
    0743-1619
  • Type

    conf

  • DOI
    10.1109/ACC.2005.1470352
  • Filename
    1470352