• DocumentCode
    439173
  • Title

    Robust CMOS compander

  • Author

    Hossack, David

  • Author_Institution
    Wolfson Microelectronics, Edinburgh, UK
  • fYear
    1997
  • fDate
    16-18 Sept. 1997
  • Firstpage
    104
  • Lastpage
    107
  • Abstract
    An improved sigma-delta compander topology is described which has been used to implement a robust compander on a CMOS process. No external components are required and test time is reduced when compared to conventional compander implementations.
  • Keywords
    CMOS process; Circuit noise; Circuit testing; Delta-sigma modulation; Envelope detectors; Filters; Frequency; Noise level; Rectifiers; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1997. ESSCIRC '97. Proceedings of the 23rd European
  • Conference_Location
    Southampton, UK
  • Type

    conf

  • Filename
    1470874
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=439173