DocumentCode
439331
Title
A sub-binary-weighted current calibration technique for a 2.5V 100MS/s 8bit ADC
Author
Mitsuishi, M. ; Yoshida, H. ; Sugawara, M. ; Kunisaki, Y. ; Nakamura, S. ; Nakaigawa, S. ; Suzuki, H.
Author_Institution
NEC Corporation, Kanagawa, Japan
fYear
1998
fDate
22-24 Sept. 1998
Firstpage
420
Lastpage
423
Abstract
Sub-binary-weighted current circuits make possible low-power and small-area calibration circuits for a low-supply-voltage two-step subranging analog-to-digital converter (ADC). Placed in the calibration circuits, they can be 71% smaller than conventional replica circuits. Moreover, they make it possible to calibrate only one time before A/D conversions, because they can hold the calibrated data during A/D conversions. Consequently, the mean power of calibration circuits can be greatly reduced. The power dissipation of calibration circuits during A/D conversions is only 0.5 mW, and the area is 0.036 mm2, which is 2.3% of the ADC core. The effectiveness of this technique has been demonstrated with a 2.5V 100MS/s 8bit ADC.
Keywords
Analog-digital conversion; Calibration; Circuits; Error correction; Laboratories; National electric code; Power dissipation; Shape; Ultra large scale integration; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 1998. ESSCIRC '98. Proceedings of the 24th European
Conference_Location
The Hague, The Netherlands
Type
conf
DOI
10.1109/ESSCIR.1998.186298
Filename
1471055
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