• DocumentCode
    439479
  • Title

    Self calibrating and adjustable CMOS pad driver for improved electromagnetic compatibility

  • Author

    Klein, Ralf ; Roemer, Dirk ; Eichfeld, Herbert ; Pfleiderer, Hans-Joerg

  • Author_Institution
    Infineon Technologies, Munich, Germany
  • fYear
    2000
  • fDate
    19-21 Sept. 2000
  • Firstpage
    93
  • Lastpage
    96
  • Abstract
    A new self calibrating and adjustable CMOS pad driver for improved electromagnetic compatibility is presented. A variable, user defined output slew rate is achieved, independent of process, supply voltage, temperature and load variations. Measurements on a test chip proved the functionality and the improvements of the driver. For example, the deviation of a slope time from the nominal value by varying supply voltage and temperature was reduced from ±25% to ±5%.
  • Keywords
    Atherosclerosis; Automotive engineering; Capacitance; Driver circuits; Electromagnetic compatibility; Pressure measurement; Semiconductor device measurement; Temperature; Timing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2000. ESSCIRC '00. Proceedings of the 26rd European
  • Conference_Location
    Stockholm, Sweden
  • Type

    conf

  • Filename
    1471221
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=439479