DocumentCode
439535
Title
Influence of substrate noise on RF performance
Author
Leenaerts, Domine ; De Vreede, Peter
Author_Institution
Philips Research Laboratories, Eindhoven, The Netherlands
fYear
2000
fDate
19-21 Sept. 2000
Firstpage
328
Lastpage
331
Abstract
A low-ohmic substrate 0.25µm CMOS process has been chosen to carry out experiments to measure the effects of substrate noise on the performance of circuits operating at radio frequencies. Clock circuits give rise to substrate noise with spectral harmonics far into the RF band. These harmonics are injected into the signal path of RF circuitry as will be demonstrated. Clock planning is therefore a major issue in mixed-signal telecommunication.
Keywords
Circuit noise; Clocks; Coupling circuits; Electrical capacitance tomography; Laboratories; MOSFET circuits; Noise measurement; RF signals; Radio frequency; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 2000. ESSCIRC '00. Proceedings of the 26rd European
Conference_Location
Stockholm, Sweden
Type
conf
Filename
1471278
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