• DocumentCode
    439562
  • Title

    A comparison of MOS varactors in fully-integrated CMOS LC VCO´s at 5 and 7 GHz

  • Author

    Ainspan, Herschel ; Plouchart, Jean-Olivier

  • Author_Institution
    IBM T. J. Watson Research Center, Yorktown Heights, N.Y.
  • fYear
    2000
  • fDate
    19-21 Sept. 2000
  • Firstpage
    447
  • Lastpage
    450
  • Abstract
    This paper examines the effect of the choice of MOS varactor on the performance of a CMOS negative resistance oscillator. The three most common MOS varactor structures (inversion, accumulation, and gated varactor) are combined with a spiral inductor over either deep trench oxide or a polysilicon patterned ground shield, to implement a matrix of six LC VCO´s in a 0.24-µm (0.18- µm Leff) SiGe BiCMOS technology[1]. Typical measured VCO phase noise is -119.7 dBc/Hz at a 1-MHz offset from a 5.67-GHz carrier, while drawing 1.6 mA from a 1.5-V supply, for a VCO figure of merit of-191 dBc/Hz.
  • Keywords
    BiCMOS integrated circuits; Germanium silicon alloys; Inductors; Noise measurement; Phase measurement; Phase noise; Silicon germanium; Spirals; Varactors; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2000. ESSCIRC '00. Proceedings of the 26rd European
  • Conference_Location
    Stockholm, Sweden
  • Type

    conf

  • Filename
    1471306