DocumentCode :
439811
Title :
A 0.7dB insertion loss CMOS-SOI antenna switch with more than 50dB isolation over the 2.5 to 5GHz band
Author :
Tinella, C. ; Fournier, J.M. ; Belot, D. ; Knopik, V.
Author_Institution :
IMEP, Grenoble-Cedex, France
fYear :
2002
fDate :
24-26 Sept. 2002
Firstpage :
483
Lastpage :
486
Abstract :
Taking full advantage of the high resistivity substrate and underlying oxide of SOI technology, a high performance CMOS SPDT T/R switch has been designed and fabricated in a partially depleted, 0.25µm SOI process. The targeted Bluetooth class II specifications have been fully fitted. The switch over the high resistivity substrate exhibits a 0.7dB insertion loss and a 50dB isolation at 2.4GHz; at 5GHz insertion loss and isolation are 1dB and 47dB respectively. The measured ICP1dBis +12dBm.
Keywords :
Bluetooth; CMOS process; CMOS technology; Conductivity; Insertion loss; Isolation technology; Radio frequency; Silicon on insulator technology; Substrates; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 2002. ESSCIRC 2002. Proceedings of the 28th European
Conference_Location :
Florence, Italy
Type :
conf
Filename :
1471570
Link To Document :
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