• DocumentCode
    439891
  • Title

    Phase noise improvement of deep submicron low-voltage VCO

  • Author

    Fong, N. ; Plett, C. ; Tarr, G. ; Plouchart, J.-O. ; Liu, D. ; Zamdmer, N. ; Wagner, L.

  • Author_Institution
    Carleton University, Canada
  • fYear
    2002
  • fDate
    24-26 Sept. 2002
  • Firstpage
    811
  • Lastpage
    814
  • Abstract
    A low-voltage wideband 3.0-5.0 GHz complementary VCO was designed and fabricated in an 0.13 µm SOI CMOS process [1]. Non-minimum gate length was used for NMOS to improve the phase noise by exploiting waveform symmetry, maximizing output swing and reducing transistor flicker noise without any penalty to VCO performance. A phase noise improvement of up to 8 dB was observed experimentally. At 1 V VDDand 3.0 GHz, the phase noise is - 122.5 dBc/Hz at 1MHz offset, and the power dissipation is 2.5mW.
  • Keywords
    1f noise; CMOS technology; Circuit noise; Frequency; Impedance; Jitter; Noise level; Phase noise; Semiconductor device noise; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2002. ESSCIRC 2002. Proceedings of the 28th European
  • Conference_Location
    Florence, Italy
  • Type

    conf

  • Filename
    1471651