DocumentCode :
439948
Title :
Laser trimming of SiCr thin-film resistors
Author :
Fehlhaber, P.
Volume :
15
fYear :
1969
fDate :
1969
Firstpage :
9
Lastpage :
10
Keywords :
Annealing; Circuit testing; Electrons; Geometrical optics; Laser beam cutting; Life testing; Resistors; Stability; Transistors; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1969 International
Conference_Location :
IEEE
Type :
conf
Filename :
1476095
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=439948
