DocumentCode

439948

Title

Laser trimming of SiCr thin-film resistors

Author

Fehlhaber, P.

Volume

15

fYear

1969

fDate

1969

Firstpage

9

Lastpage

10

Keywords

Annealing; Circuit testing; Electrons; Geometrical optics; Laser beam cutting; Life testing; Resistors; Stability; Transistors; Wiring;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices Meeting, 1969 International

Conference_Location

IEEE

Type

conf

Filename

1476095