DocumentCode :
440017
Title :
The principle and experimental results of an all electrostatic, no-mesh, return-beam, electron camera readout system
Author :
Chen, H.Y. ; Glenn, William E.
Volume :
21
fYear :
1975
fDate :
1975
Firstpage :
81
Lastpage :
84
Abstract :
An all electrostatic deflecting lens (EDL), return-beam system has been developed as the read-out section of an electron camera. The most important feature of the EDL system is that there is no field stopping mesh used, which is a design breakthrough in return-beam imaging devices. Due to the elimination of the field stopping mesh, ultra-high resolution becomes possible. The system was tested at electron landing energy ranging from practically "zero" e.v. to 14kv. In a 2.86cm \\times 2.86 cm raster scan, the typical on-axis modulation transfer function (MTF) at a spatial frequency of 100lp/mm is 0.67 for high-energy landing and 0.55 for low-energy landing. The linear scan is 7,000 spot diameter at high-energy landing and around 6,000 spot diameter at low-energy landing.
Keywords :
Cameras; Electron optics; Electronic equipment testing; Electrostatics; Energy resolution; Lenses; Optical refraction; Optical variables control; Spatial resolution; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1975 International
Conference_Location :
IEEE
Type :
conf
Filename :
1478191
Link To Document :
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