DocumentCode :
440018
Title :
A second generation Ebes
Author :
Alles, D.S. ; Ashley, F.R. ; Collier, R.J. ; Herriott, D.R. ; Johnson, Amy M. ; Thomson, M.G.R.
Volume :
21
fYear :
1975
fDate :
1975
Firstpage :
1
Lastpage :
1
Keywords :
Control systems; Electron beams; Laboratories; Prototypes; Silicon; Solid state circuits; Writing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1975 International
Conference_Location :
IEEE
Type :
conf
Filename :
1478330
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=440018
