Title :
Network representation of the large-signal transient response of MOS transistors
Author :
Lindholm, F.A. ; Arreola, J.I.
Keywords :
Automatic testing; Circuit simulation; Circuit testing; Contracts; MOS capacitors; MOSFETs; Transient response;
Conference_Titel :
Electron Devices Meeting, 1975 International
Conference_Location :
IEEE
