DocumentCode

440059

Title

Base resistance, parasitic diode shunting and high-level PNP injection effects on I²L performance

Author

Bhattacharyya, A.

Volume

22

fYear

1976

fDate

1976

Firstpage

11

Lastpage

12

Keywords

Circuit simulation; Delay effects; Diodes; Doping; Immune system; Inverters; Ion implantation; MOSFETs; Probes; Propagation delay;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices Meeting, 1976 International

Conference_Location

IEEE

Type

conf

Filename

1478855