DocumentCode

440062

Title

Reliability of pulsed and CW electron-beam semiconductor devices

Author

True, R.M. ; Baxendale, J.F.

Volume

22

fYear

1976

fDate

1976

Firstpage

15

Lastpage

15

Keywords

Semiconductor device reliability; Semiconductor devices;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices Meeting, 1976 International

Conference_Location

IEEE

Type

conf

Filename

1478858