Title :
Space-frequency correlation model for multi antenna, multi-band OFDM in UWB communication systems
Author :
Yong, S.K. ; Chong, Chia-Chin ; Pandharipande, A. ; Lee, S.S.
Author_Institution :
Commun. & Networking Lab., Samsung Adv. Inst. of Technol., Suwon, South Korea
Abstract :
In this paper space-frequency correlation model for multi antennas, multi band orthogonal frequency division multiplexing (OFDM) is developed. The correlation model is expressed in closed-form in terms of azimuth spread, elevation spread, mean azimuth-of-arrival and mean elevation-of-arrival of the underlying angle of arrival statistics, delay spread, antenna separation, antenna positions and frequencies of the band of interest in multi band OFDM proposal. We show that for an array that exploits space-frequency diversity, the spatial correlation of the array is jointly contributed by the actual spatial correlation and the inherent frequency correlation due to different frequency components used. Furthermore, with this model, optimum parameters can also be deduced for system employing space-frequency diversity schemes. The developed model can also be used for capacity analysis of future multi-band OFDM based multiple-input-multiple-output systems.
Keywords :
MIMO systems; OFDM modulation; antenna arrays; correlation methods; direction-of-arrival estimation; diversity reception; ultra wideband antennas; ultra wideband communication; UWB communication system; angle of arrival statistic; antenna arrays; antenna position; antenna separation; delay spread; mean azimuth-of-arrival; mean elevation-of-arrival; multiantenna multiband OFDM; multiple-input-multiple-output system; orthogonal frequency division multiplexing; space-frequency correlation model; space-frequency diversity; Antenna arrays; Antennas and propagation; Azimuth; Directive antennas; Frequency diversity; OFDM; Proposals; Ultra wideband antennas; Ultra wideband communication; Ultra wideband technology;
Conference_Titel :
Intelligent Vehicles Symposium, 2005. Proceedings. IEEE
Print_ISBN :
0-7803-8961-1
DOI :
10.1109/IVS.2005.1505156