Title :
Challenges in Compact Modelling of Future RF CMOS
Author :
Klaassen, D.B.M. ; van Langevelde, R. ; Scholten, A.J. ; Tiemeijer, L.F.
Author_Institution :
Philips Research Laboratories, Eindhoven, The Netherlands
Keywords :
CMOS process; CMOS technology; Circuit simulation; Gold; Integrated circuit modeling; Laboratories; Low-noise amplifiers; Radio frequency; Semiconductor device modeling; Voltage;
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1
