DocumentCode

440218

Title

Non-Invasive Optical Characterisation Technique for Fast Switching CMOS Circuits

Author

Stellari, F. ; Zappa, F. ; Ghioni, M. ; Cova, S.

Author_Institution

Politecnico di Milano, Italy

Volume

1

fYear

1999

fDate

13-15 Sept. 1999

Firstpage

172

Lastpage

175

Keywords

Bandwidth; Circuit testing; Crosstalk; Detectors; Electron beams; High speed optical techniques; MOSFETs; Optical buffering; Optical sensors; Switching circuits;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 1999. Proceeding of the 29th European

Conference_Location

Leuven, Belgium

Print_ISBN

2-86332-245-1

Type

conf

Filename

1505467