DocumentCode

440241

Title

Reliability of Magnetic Tunnel-Junctions

Author

Boeve, H. ; Oepts, W. ; Girgis, E. ; Schelten, J. ; Coehoorn, R. ; Boeck, J. De ; Borghs, G.

Author_Institution

IMEC, Leuven, Belgium

Volume

1

fYear

1999

fDate

13-15 Sept. 1999

Firstpage

276

Lastpage

279

Keywords

Electrodes; Energy states; Insulation; Magnetic heads; Magnetic materials; Magnetic separation; Magnetic tunneling; Magnetization; Oxidation; Thermal resistance;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 1999. Proceeding of the 29th European

Conference_Location

Leuven, Belgium

Print_ISBN

2-86332-245-1

Type

conf

Filename

1505493