Title :
Low temperature analysis of 0.25 T-Gate SiGe n-MODFET
Author :
Zerounian, N. ; Aniel, F. ; Adde, R. ; Zeuner, M. ; Hackbarth, T. ; Gruhle, A. ; König, U.
Author_Institution :
Universite Paris-Sud, Orsay, France
Keywords :
Equivalent circuits; Frequency measurement; Germanium silicon alloys; HEMTs; Hafnium; MODFET circuits; Performance analysis; Performance evaluation; Silicon germanium; Temperature;
Conference_Titel :
Solid-State Device Research Conference, 1999. Proceeding of the 29th European
Conference_Location :
Leuven, Belgium
Print_ISBN :
2-86332-245-1