• DocumentCode
    440262
  • Title

    Low Temperature Generation of Stress Induced Leakage Current. Degradation Mechanism: E or 1/E Model?

  • Author

    Riess, P. ; Ghibaudo, G. ; Pananakakis, G.

  • Author_Institution
    LPCS / ENSERG, Grenoble, France
  • Volume
    1
  • fYear
    1999
  • fDate
    13-15 Sept. 1999
  • Firstpage
    364
  • Lastpage
    367
  • Keywords
    Carbon capture and storage; Degradation; Density measurement; Electric breakdown; Leakage current; Stress measurement; Temperature dependence; Temperature measurement; Temperature sensors; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 1999. Proceeding of the 29th European
  • Conference_Location
    Leuven, Belgium
  • Print_ISBN
    2-86332-245-1
  • Type

    conf

  • Filename
    1505515
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=440262