Off-State Breakdown in GaAs Power HFETs

Author

Cova, Paolo ; Menozzi, Roberto ; Dieci, Domenico ; Canali, Claudio ; Pavesi, Maura ; Meneghesso, Gaudenzio

Author_Institution

University of Parma, Italy

Volume

fYear

1999

fDate

13-15 Sept. 1999

Firstpage

544

Lastpage

547

Keywords

Breakdown voltage; Current measurement; Electric breakdown; FETs; Frequency; Gallium arsenide; HEMTs; Irrigation; MODFETs; Power measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 1999. Proceeding of the 29th European

Conference_Location

Leuven, Belgium

Print_ISBN

2-86332-245-1

Type

Filename

1505560

Link To Document