Title :
A Study On Temperature Distribution of arc Cross Section of Low-Voltage Apparatus
Author :
Liu, Jiao-min ; Zhao, Jie ; Tan, Bai-Hong ; Wang, Zhen-zhou
Author_Institution :
Heibei University of Technology, Tianjin 300130, China; E-MAIL: jmliu@hebust.edu.cn
Abstract :
In this paper, a set of hardware instruments used to collect arc radiant intensity in three directions were designed by using single area CCD based on high temperature characteristic of low-voltage apparatus switch arc, and the principle of computer tomogram and corresponding image processing software was also developed. We took pictures for the projection of breaking arc radiation of the low-voltage AC contactor in inductance circuits, and rebuilt its temperature distribution on different sections when burning.
Keywords :
CCD; Low voltage apparatus; computer tomogram; switching arc; temperature field; Charge coupled devices; Contacts; Fourier transforms; Plasma measurements; Plasma temperature; Switches; Temperature distribution; Temperature measurement; Temperature sensors; Wavelength measurement; CCD; Low voltage apparatus; computer tomogram; switching arc; temperature field;
Conference_Titel :
Machine Learning and Cybernetics, 2005. Proceedings of 2005 International Conference on
Conference_Location :
Guangzhou, China
Print_ISBN :
0-7803-9091-1
DOI :
10.1109/ICMLC.2005.1526965
