• DocumentCode
    441986
  • Title

    A new method of early fault diagnosis based on machine learning

  • Author

    Shi, Wen-Wu ; Yan, Hong-Sen ; Ma, Kai-Ping

  • Author_Institution
    Res. Inst. of Autom., Southeast Univ., Nanjing, China
  • Volume
    6
  • fYear
    2005
  • fDate
    18-21 Aug. 2005
  • Firstpage
    3271
  • Abstract
    A new method of early fault diagnosis for manufacturing system based on machine learning is presented. It is necessary for manufacturing enterprises to detect the states of production process in real time, in order to find the early faults in machines, so that the losses of production failure and investments of facility maintenance can be minimized. This paper proposes a new fault diagnosis model, which extracts multi-dimension features from the detected signal to supervise the different features of the signal simultaneously. Based on the model, the method of inductive learning is adopted to obtain the statistical boundary vectors of the signal automatically, and then a normal feature space is built, according to which an abnormal signal can be detected, and consequently the faults in a complicated system can be found easily. Furthermore, under the condition of without existing fault samples, the precise results of fault diagnosis can also be achieved in real time. The theoretical analysis and simulation example demonstrate the effectiveness of the method.
  • Keywords
    fault diagnosis; learning (artificial intelligence); maintenance engineering; manufacturing systems; signal detection; fault diagnosis model; fault samples; feature extraction; machine learning; manufacturing system; statistical boundary vector; theoretical analysis; Computer vision; Fault detection; Fault diagnosis; Feature extraction; Investments; Machine learning; Manufacturing processes; Manufacturing systems; Production; Signal detection; Fault Diagnosis; Feature Extraction; Machine Learning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Machine Learning and Cybernetics, 2005. Proceedings of 2005 International Conference on
  • Conference_Location
    Guangzhou, China
  • Print_ISBN
    0-7803-9091-1
  • Type

    conf

  • DOI
    10.1109/ICMLC.2005.1527507
  • Filename
    1527507