• DocumentCode
    442108
  • Title

    Computer aided test and diagnosis model for exceptional signals detection and classification by using WT-SVM

  • Author

    Xian, Guang-Ming ; Wang, Zhi-Yan ; Xian, Guang-Lin

  • Author_Institution
    Sch. of Comput. Sci. & Eng., South China Univ. of Technol., Guangzhou, China
  • Volume
    7
  • fYear
    2005
  • fDate
    18-21 Aug. 2005
  • Firstpage
    4271
  • Abstract
    In order to detect and diagnosis the exceptional signals, this paper presents a new computer aided test and diagnosis (CAT/CAD) model based on wavelet transform (WT) and support vector machine (SVM). The architecture of the CAT and CAD model and experimental feature extraction and pattern recognition by WT-SVM system are presented. The features of special frequency segment of the signal picked up by the method of wavelet decomposition are used as the inputs of SVM. The analysis of the experimental data proves that the model proposed is efficient and simple to recognize exceptional signals. The experimental result indicated that the error rate of SVM is lower than the one obtained by applying KNN classifier and Fisher classifier methods whether the training set is small or huge. The experiment also demonstrates that SVM can be extremely effective in minimizing the error rate lower than LVQ and BP neural network methods.
  • Keywords
    diagnostic expert systems; feature extraction; learning (artificial intelligence); signal classification; signal detection; support vector machines; wavelet transforms; Fisher classifier; KNN classifier; computer aided diagnosis; computer aided test; exceptional signal classification; exceptional signal detection; feature extraction; machine learning; pattern recognition; signal recognition; statistical learning theory; support vector machine; wavelet decomposition; wavelet transform; Error analysis; Feature extraction; Frequency; Pattern recognition; Signal analysis; Signal detection; Support vector machine classification; Support vector machines; Testing; Wavelet transforms; Computer aided test and diagnosis; detection and classification; machine learning; signal recognition; statistic learning theory; support vector machine; wavelet transform;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Machine Learning and Cybernetics, 2005. Proceedings of 2005 International Conference on
  • Conference_Location
    Guangzhou, China
  • Print_ISBN
    0-7803-9091-1
  • Type

    conf

  • DOI
    10.1109/ICMLC.2005.1527687
  • Filename
    1527687