DocumentCode :
442108
Title :
Computer aided test and diagnosis model for exceptional signals detection and classification by using WT-SVM
Author :
Xian, Guang-Ming ; Wang, Zhi-Yan ; Xian, Guang-Lin
Author_Institution :
Sch. of Comput. Sci. & Eng., South China Univ. of Technol., Guangzhou, China
Volume :
7
fYear :
2005
fDate :
18-21 Aug. 2005
Firstpage :
4271
Abstract :
In order to detect and diagnosis the exceptional signals, this paper presents a new computer aided test and diagnosis (CAT/CAD) model based on wavelet transform (WT) and support vector machine (SVM). The architecture of the CAT and CAD model and experimental feature extraction and pattern recognition by WT-SVM system are presented. The features of special frequency segment of the signal picked up by the method of wavelet decomposition are used as the inputs of SVM. The analysis of the experimental data proves that the model proposed is efficient and simple to recognize exceptional signals. The experimental result indicated that the error rate of SVM is lower than the one obtained by applying KNN classifier and Fisher classifier methods whether the training set is small or huge. The experiment also demonstrates that SVM can be extremely effective in minimizing the error rate lower than LVQ and BP neural network methods.
Keywords :
diagnostic expert systems; feature extraction; learning (artificial intelligence); signal classification; signal detection; support vector machines; wavelet transforms; Fisher classifier; KNN classifier; computer aided diagnosis; computer aided test; exceptional signal classification; exceptional signal detection; feature extraction; machine learning; pattern recognition; signal recognition; statistical learning theory; support vector machine; wavelet decomposition; wavelet transform; Error analysis; Feature extraction; Frequency; Pattern recognition; Signal analysis; Signal detection; Support vector machine classification; Support vector machines; Testing; Wavelet transforms; Computer aided test and diagnosis; detection and classification; machine learning; signal recognition; statistic learning theory; support vector machine; wavelet transform;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Machine Learning and Cybernetics, 2005. Proceedings of 2005 International Conference on
Conference_Location :
Guangzhou, China
Print_ISBN :
0-7803-9091-1
Type :
conf
DOI :
10.1109/ICMLC.2005.1527687
Filename :
1527687
Link To Document :
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