• DocumentCode
    442113
  • Title

    Support vector data description with model selection for condition monitoring

  • Author

    Pan, Ming-Qing ; Qian, Su-Xiang ; Lei, Liang-Yu ; Zhou, Xiao-Jun

  • Author_Institution
    Inst. of Modern Manuf. Eng., Zhejiang Univ., Hangzhou, China
  • Volume
    7
  • fYear
    2005
  • fDate
    18-21 Aug. 2005
  • Firstpage
    4315
  • Abstract
    Condition monitoring is very important in machinery engineering study. In most conditions, normal signals are acquired easily but fault samples are difficult to be gained. Because of lacking enough fault samples, the machine diagnosis meets difficulties. Support vector data description (SVDD) is a single classifier and it can distinguish the normal and fault condition just using normal samples. In this paper we first describe the basic algorithm of SVDD. 5-cross validation is used as model selection to optimize the parameter of SVDD. Extracting two-dimension spectrum entropy of signals as the input of the SVDD classifier, we got high classification. Compared neural network (ANN) with SVDD, the experiment result represents that in the environment which lacks of enough fault samples condition monitoring, SVDD has better classification than ANN.
  • Keywords
    condition monitoring; entropy; fault diagnosis; feature extraction; machine testing; mechanical engineering; signal classification; signal detection; support vector machines; 2D spectrum entropy extraction; 5-cross validation; condition monitoring; fault condition; fault samples; feature extraction; machine diagnosis; machinery engineering; model selection; parameter optimization; signal acquisition; signal classification; support vector data description; Artificial intelligence; Artificial neural networks; Condition monitoring; Data engineering; Fault diagnosis; Feature extraction; Machine intelligence; Machinery; Mechanical engineering; Virtual manufacturing; Condition Monitoring; Feature Extraction; Model Selection; Support Vector Data Description;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Machine Learning and Cybernetics, 2005. Proceedings of 2005 International Conference on
  • Conference_Location
    Guangzhou, China
  • Print_ISBN
    0-7803-9091-1
  • Type

    conf

  • DOI
    10.1109/ICMLC.2005.1527696
  • Filename
    1527696