DocumentCode :
442187
Title :
Learning pseudo metrics for semantic image clustering
Author :
Wang, Dian-Hui ; Kim, Yong Soo
Author_Institution :
Dept. of Comput. Sci. & Comput. Eng., La Trobe Univ., Melbourne, Vic., Australia
Volume :
8
fYear :
2005
fDate :
18-21 Aug. 2005
Firstpage :
4973
Abstract :
While people cluster images in terms of semantics, computers can not do too much on this job due to the use of lower-level features, which is the common way to computer workers to deal with the image recognition. To measure the closeness between feature vectors, similarity metrics play a key role and they directly impact the clustering performance. This paper develops a framework of learning pseudo metrics (LPM) for semantic image clustering practice. Multilayer perceptron (MLP) is employed to model the LPM with a set of criteria on evaluating the LPM quality and availability. Using a standard k-mean clustering technique, a comparative study is carried out to demonstrate the significance of our proposed LPM in semantic image clustering. Experiments show that the LPM-based similarity metric can produce better clustering results in terms of both impurity and robustness.
Keywords :
feature extraction; image recognition; image segmentation; learning (artificial intelligence); multilayer perceptrons; pattern clustering; feature vector; image recognition; k-mean clustering technique; learning pseudo metrics; multilayer perceptron; semantic image clustering; Availability; Computer science; Educational institutions; Image databases; Image recognition; Machine learning; Multilayer perceptrons; Prototypes; Silicon carbide; Spatial databases; Semantic images; clustering; learning pseudo metrics; neural networks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Machine Learning and Cybernetics, 2005. Proceedings of 2005 International Conference on
Conference_Location :
Guangzhou, China
Print_ISBN :
0-7803-9091-1
Type :
conf
DOI :
10.1109/ICMLC.2005.1527819
Filename :
1527819
Link To Document :
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