Title :
Fault Detection Using Non-Linear Model-Based Approach
Author :
Valh, D. ; Bratina, B. ; Tovornik, B.
Keywords :
Data acquisition; Data mining; Electrical engineering; Electrical fault detection; Fault detection; Laboratories; Mathematical model; Nonlinear equations; Signal processing; Testing;
Conference_Titel :
Industrial Electronics, 2005. ISIE 2005. Proceedings of the IEEE International Symposium on
Conference_Location :
Dubrovnik, Croatia
Print_ISBN :
0-7803-8738-4
DOI :
10.1109/ISIE.2005.1528914
