• DocumentCode
    442735
  • Title

    Incorporating subsurface attenuation into the Beckmann model

  • Author

    Ragheb, Hossein ; Hancock, Edwin R.

  • Author_Institution
    Dept. of Comput. Sci., York Univ., UK
  • Volume
    2
  • fYear
    2005
  • fDate
    11-14 Sept. 2005
  • Abstract
    In this paper we explore whether the Fresnel term can be used to improve the predictions of the Beckmann-Kirchhoff (B-K) model for moderately-rough surfaces. Our arm in developing this model is to describe subsurface scattering effects for surfaces of intermediate roughness. We use the BRDF measurements from the CUReT database to compare the predictions of the Fresnel correction process with several variants of the B-K model and the Oren and Nayar Model. The study reveals that our new Fresnel correction provides accurate predictions, which are considerably better than those achieved using both the alternative variants of the B-K model and the Oren-Nayar model.
  • Keywords
    electromagnetic wave scattering; rough surfaces; Beckmann-Kirchhoff model; Fresnel correction process; Oren-Nayar model; moderately-rough surfaces; subsurface scattering effects; Attenuation; Computer vision; Databases; Light scattering; Optical refraction; Predictive models; Reflectivity; Rough surfaces; Surface roughness; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 2005. ICIP 2005. IEEE International Conference on
  • Print_ISBN
    0-7803-9134-9
  • Type

    conf

  • DOI
    10.1109/ICIP.2005.1530089
  • Filename
    1530089