DocumentCode :
442735
Title :
Incorporating subsurface attenuation into the Beckmann model
Author :
Ragheb, Hossein ; Hancock, Edwin R.
Author_Institution :
Dept. of Comput. Sci., York Univ., UK
Volume :
2
fYear :
2005
fDate :
11-14 Sept. 2005
Abstract :
In this paper we explore whether the Fresnel term can be used to improve the predictions of the Beckmann-Kirchhoff (B-K) model for moderately-rough surfaces. Our arm in developing this model is to describe subsurface scattering effects for surfaces of intermediate roughness. We use the BRDF measurements from the CUReT database to compare the predictions of the Fresnel correction process with several variants of the B-K model and the Oren and Nayar Model. The study reveals that our new Fresnel correction provides accurate predictions, which are considerably better than those achieved using both the alternative variants of the B-K model and the Oren-Nayar model.
Keywords :
electromagnetic wave scattering; rough surfaces; Beckmann-Kirchhoff model; Fresnel correction process; Oren-Nayar model; moderately-rough surfaces; subsurface scattering effects; Attenuation; Computer vision; Databases; Light scattering; Optical refraction; Predictive models; Reflectivity; Rough surfaces; Surface roughness; Surface waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing, 2005. ICIP 2005. IEEE International Conference on
Print_ISBN :
0-7803-9134-9
Type :
conf
DOI :
10.1109/ICIP.2005.1530089
Filename :
1530089
Link To Document :
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