DocumentCode
442735
Title
Incorporating subsurface attenuation into the Beckmann model
Author
Ragheb, Hossein ; Hancock, Edwin R.
Author_Institution
Dept. of Comput. Sci., York Univ., UK
Volume
2
fYear
2005
fDate
11-14 Sept. 2005
Abstract
In this paper we explore whether the Fresnel term can be used to improve the predictions of the Beckmann-Kirchhoff (B-K) model for moderately-rough surfaces. Our arm in developing this model is to describe subsurface scattering effects for surfaces of intermediate roughness. We use the BRDF measurements from the CUReT database to compare the predictions of the Fresnel correction process with several variants of the B-K model and the Oren and Nayar Model. The study reveals that our new Fresnel correction provides accurate predictions, which are considerably better than those achieved using both the alternative variants of the B-K model and the Oren-Nayar model.
Keywords
electromagnetic wave scattering; rough surfaces; Beckmann-Kirchhoff model; Fresnel correction process; Oren-Nayar model; moderately-rough surfaces; subsurface scattering effects; Attenuation; Computer vision; Databases; Light scattering; Optical refraction; Predictive models; Reflectivity; Rough surfaces; Surface roughness; Surface waves;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing, 2005. ICIP 2005. IEEE International Conference on
Print_ISBN
0-7803-9134-9
Type
conf
DOI
10.1109/ICIP.2005.1530089
Filename
1530089
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