Title :
Bi-directional PCA with assembled matrix distance metric
Author :
Zuo, Wangmeng ; Wang, Kuanquan ; Zhang, David
Author_Institution :
Sch. of Comput. Sci. & Technol., Harbin Inst. of Technol., China
Abstract :
Principal component analysis (PCA) has been very successful in image recognition. Recent researches on PCA-based methods are mainly concentrated on two issues, feature extraction and classification. In this paper we propose bi-directional PCA (BDPCA) with assembled matrix distance (AMD) metric to simultaneously deal with these two issues. For feature extraction, we propose a BDPCA approach which can reduce the dimension of the original image matrix in both column and row directions. For classification, we present an AMD metric to calculate the distance between two feature matrices. The results of our experiments show that, BDPCA with AMD metric is very effective in image recognition.
Keywords :
feature extraction; image classification; matrix algebra; principal component analysis; PCA; assembled matrix distance metric; bidirectional PCA; feature extraction; feature matrices; image matrix; image recognition; principal component analysis; Assembly; Computer science; Face recognition; Feature extraction; Glass; Image databases; Image recognition; Neural networks; Principal component analysis; Testing; 2DPCA; PCA; face recognition; image recognition; palmprint recognition;
Conference_Titel :
Image Processing, 2005. ICIP 2005. IEEE International Conference on
Print_ISBN :
0-7803-9134-9
DOI :
10.1109/ICIP.2005.1530216