Title :
A 15-bit 30 MS/s 145 mW three-step ADC for imaging applications
Author :
Van der Ploeg, Hendrik ; Vertregt, Maarten ; Lammers, Marco
Author_Institution :
Philips Res., Eindhoven, Netherlands
Abstract :
A 15-bit 30 MS/s three-step ADC for imaging applications is presented with a peak-to-peak signal to rms noise ratio of 84 dB. The offsets of the residue amplifiers are independently background calibrated. The ADC is realized in single poly, 0.18 μm CMOS, measures 1.4 mm2 and dissipates 145 mW from 1.8 V and 3.3 V supplies.
Keywords :
CMOS integrated circuits; amplifiers; analogue-digital conversion; image processing; low-power electronics; mixed analogue-digital integrated circuits; 0.18 micron; 1.8 V; 145 mW; 15 bit; 3.3 V; CMOS technology; imaging applications; residue amplifiers; three step ADC; Charge coupled devices; Digital signal processing; Dynamic range; Energy consumption; Image converters; Matrix converters; Quantization; Signal processing; Signal to noise ratio; Switches;
Conference_Titel :
Solid-State Circuits Conference, 2005. ESSCIRC 2005. Proceedings of the 31st European
Print_ISBN :
0-7803-9205-1
DOI :
10.1109/ESSCIR.2005.1541584
