Title :
Developing a strategic error source based design evaluation for ADC´s
Author :
Hannon, Jason ; Wegener, Carsten ; Kennedy, Michael Peter
Author_Institution :
Dept. of Microelectron. Eng., Coll. Cork Univ., Ireland
Abstract :
In this work, we develop the foundation of an error source based design evaluation and apply it to the example of a successive-approximation-register (SAR) analog-to-digital converter (ADC). The proposed approach identifies the error sources in the design and relates them to the performance characteristics measured for prototype samples. Based on this identification, we extract the sources of dominant performance degradation and suggest a redesign to counter act the latter.
Keywords :
analogue-digital conversion; integrated circuit design; analog-to-digital converters; design evaluation; strategic error source; successive-approximation-register; Analog-digital conversion; Counting circuits; Degradation; Design engineering; Educational institutions; Electronic mail; Manufacturing processes; Measurement standards; Microelectronics; Prototypes;
Conference_Titel :
Research in Microelectronics and Electronics, 2005 PhD
Print_ISBN :
0-7803-9345-7
DOI :
10.1109/RME.2005.1543006