DocumentCode
443523
Title
Noise plus interference power estimation in adaptive OFDM systems
Author
Yücek, Tevfik ; Arslan, Hüseyin
Author_Institution
Dept. of Electr. Eng., South Florida Univ., Tampa, FL, USA
Volume
2
fYear
2005
fDate
30 May-1 June 2005
Firstpage
1278
Abstract
Noise variance and signal-to-noise ratio (SNR) are important parameters for adaptive orthogonal frequency division multiplexing (OFDM) systems since they serve as a standard measure of signal quality. Conventional algorithms assume that the noise statistics remain constant over the OFDM frequency band, and thereby average the instantaneous noise samples to get a single estimate. In reality, noise is often made up of white Gaussian noise along with correlated colored noise that affects the OFDM spectrum unevenly. This paper proposes an adaptive windowing technique to estimate the noise power that takes into account the variation of the noise statistics across the OFDM sub-carrier index as well as across OFDM symbols. The proposed method provides many local estimates, allowing tracking of the variation of the noise statistics in frequency and time. A mean-squared-error (MSE) expression in order to choose the optimal window dimensions for averaging in time and frequency is derived. Evaluation of the performance with computer simulations show that the proposed method tracks the local statistics of the noise more efficiently than conventional methods.
Keywords
AWGN; OFDM modulation; adaptive signal processing; mean square error methods; signal denoising; time-frequency analysis; MSE; adaptive OFDM systems; adaptive orthogonal frequency division multiplexing; adaptive windowing technique; correlated colored noise; mean-squared-error; noise plus interference power estimation; noise statistics; white Gaussian noise; Adaptive systems; Colored noise; Frequency estimation; Frequency measurement; Gaussian noise; Interference; Measurement standards; OFDM; Signal to noise ratio; Statistics;
fLanguage
English
Publisher
ieee
Conference_Titel
Vehicular Technology Conference, 2005. VTC 2005-Spring. 2005 IEEE 61st
ISSN
1550-2252
Print_ISBN
0-7803-8887-9
Type
conf
DOI
10.1109/VETECS.2005.1543514
Filename
1543514
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