• DocumentCode
    443978
  • Title

    Interval set representations of 1-v-r support vector machine multi-classifiers

  • Author

    Lingras, Pawan ; Butz, Cory

  • Author_Institution
    Dept. of Math. & Comput. Sci., Saint Mary´´s Univ., Halifax, NS, Canada
  • Volume
    1
  • fYear
    2005
  • fDate
    25-27 July 2005
  • Firstpage
    193
  • Abstract
    Support vector machines (SVMs) are designed for linearly separating binary classes. Researchers have suggested various approaches, such as the one-versus-rest (1-v-r), one-versus-one (1-v-1) and DAGSVM, for applying SVMs to multi-classification problems. The 1-v-r approach tends to have a large training time, while the 1-v-1 and DAGSVM approaches often store a large number of SVMs. We have recently shown how traditional SVMs can be represented using interval or rough sets. In this paper, we extend the interval set formulation of SVMs to classifications that involve more than two classes that are separated using the 1-v-r approach. Our approach possesses several salient features. The presented work is especially useful for soft margin classifiers. Our approach seeks a balance by reducing the training time while storing fewer rules. Finally, our technique provides a semantic interpretation of the classification process, as opposed to the black-box SVM methods.
  • Keywords
    learning (artificial intelligence); pattern classification; rough set theory; support vector machines; DAGSVM approach; binary class; black-box SVM method; interval set representation; multiclassification problem; one versus rest approach; one verus one approach; rough set theory; semantic interpretation; soft margin classifier; support vector machine; Computer science; Decision making; Kernel; Multilayer perceptrons; Neural networks; Rough sets; Set theory; Support vector machine classification; Support vector machines; Testing; Support vector machines; classification; multiclass; rough sets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Granular Computing, 2005 IEEE International Conference on
  • Print_ISBN
    0-7803-9017-2
  • Type

    conf

  • DOI
    10.1109/GRC.2005.1547265
  • Filename
    1547265