DocumentCode :
444292
Title :
Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation
Author :
Ramsay, Euan ; Xiao, Dong ; Reid, Derryck T. ; Offenbeck, Bernd ; Sundermeyer, Jan ; Seemann, Kay ; Weber, Norbert
Author_Institution :
Ultrafast Opt. Group, Heriot-Watt Univ., Edinburgh, UK
Volume :
2
fYear :
2005
fDate :
22-27 May 2005
Firstpage :
818
Abstract :
We report the use of electric-field-induced second harmonic generation to investigate the electrical signal in a CMOS chip with 2.3 μm femtosecond pulses. A linear relationship between the signal and electric field is found.
Keywords :
CMOS integrated circuits; high-speed optical techniques; optical harmonic generation; semiconductor devices; silicon; 2.3 micron; Si; femtosecond pulses; probing electrical signals; second harmonic generation; silicon CMOS devices; Frequency conversion; Laser excitation; Nonlinear optics; Optical harmonic generation; Optical pumping; Photodiodes; Photonic band gap; Probes; Silicon; Ultrafast optics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2005. QELS '05
Print_ISBN :
1-55752-796-2
Type :
conf
DOI :
10.1109/QELS.2005.1548948
Filename :
1548948
Link To Document :
بازگشت