Title :
Using thermal profiling to quantify optical feedback into semiconductor lasers
Author :
Kapusta, Evelyn ; Luerssen, D. ; Hudgings, Janice
Author_Institution :
Dept. of Phys., Mount Holyoke Coll., South Hadley, MA, USA
Abstract :
Thermal profiling is an ideal technique for monitoring optical feedback into semiconductor lasers in photonic integrated circuits. Quantitative measurements of optical output power, optical feedback magnitude, and threshold current shift are obtained without optical measurements.
Keywords :
integrated optoelectronics; laser beams; laser feedback; semiconductor lasers; thermo-optical effects; optical feedback magnitude measurement; optical feedback monitoring; optical output power measurement; photonic integrated circuit; quantitative measurement; semiconductor lasers; thermal profiling; threshold current shift measurement; Current measurement; Integrated circuit measurements; Laser feedback; Monitoring; Optical feedback; Photonic integrated circuits; Power generation; Power measurement; Semiconductor lasers; Threshold current;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2005. QELS '05
Print_ISBN :
1-55752-796-2
DOI :
10.1109/QELS.2005.1549013
