DocumentCode
444625
Title
Resonant determination of the dielectric properties of materials in the microwave range
Author
Anis, Michael ; Jöstingmeier, Andreas ; Meyer, Tobias ; Omar, Abbas S.
Author_Institution
Univ. of Magdeburg, Germany
Volume
1A
fYear
2005
fDate
3-8 July 2005
Firstpage
421
Abstract
This paper describes the determination of the complex permittivity of dielectric materials in the Ku-band. For the determination of the real part of the permittivity a section of a rectangular cavity resonator is filled with the unknown material. The reflection coefficient of this loaded cavity setup is measured by a vector network analyzer. From the measured resonant frequency the real part of the permittivity can be calculated using a 3D FDTD field solver and an interpolation technique. In order to determine the loss tangent two identically shaped cavities are used, one made of copper and another one made of brass. The reflection coefficient of both types of cavities is measured twice namely with and without dielectric load. Applying this method it is possible to distinguish between the ohmic losses of the cavity and the dielectric losses of the sample. Experimental results are presented for PTFE and AK4.
Keywords
brass; cavity resonators; copper; dielectric losses; dielectric materials; electromagnetic wave reflection; finite difference time-domain analysis; interpolation; microwave materials; permittivity measurement; 3D FDTD field solver; AK4; Ku-band; PTFE; brass; complex permittivity; copper; dielectric losses; dielectric materials; dielectric properties; interpolation technique; loaded cavity; loss tangent; microwave materials; ohmic losses; rectangular cavity resonator; reflection coefficient; resonant frequency; Cavity resonators; Dielectric losses; Dielectric materials; Dielectric measurements; Finite difference methods; Frequency measurement; Permittivity measurement; Reflection; Resonance; Resonant frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2005 IEEE
Print_ISBN
0-7803-8883-6
Type
conf
DOI
10.1109/APS.2005.1551342
Filename
1551342
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