DocumentCode
444707
Title
The diagonalized contrast source inversion method for acoustic and electromagnetic inverse scattering problems
Author
Abubakar, Aria ; Habashy, Tarek M. ; Van Den Berg, Peter M.
Author_Institution
Schlumberger-Doll Res., Ridgefield, CT
Volume
1B
fYear
2005
fDate
2005
Firstpage
195
Abstract
In the present work, we introduce a new three-step procedure which introduces a localized approximation of the scattering operator without enforcing an explicit form. The linear inversion steps follow what is referred to as the source-type integral equation (STIE) approach, in which the contrast sources are inverted for in the first step from the linear data equation. Once the contrast sources have been determined, the total internal fields follow from a direct application of the object equation. In the third and final step, the contrast function is estimated using one of two approaches. In the first approach the contrast function is estimated directly from the constitutive relation. Whereas in the second approach the contrast function is estimated by solving the data equation again, this time in terms of the contrast profile. What makes such approaches feasible, is the introduction of a diagonalization approximation of the full contrast operator. This allows the STIE approach with its three linear steps to be implemented in a robust manner, in which the nonuniqueness encountered in the reconstruction of the contrast sources in the first step is alleviated by the imposition of the diagonal form constraint on the contrast operator
Keywords
acoustic wave scattering; approximation theory; electromagnetic wave scattering; integral equations; acoustic; diagonalization approximation; diagonalized contrast source inversion method; electromagnetic inverse scattering problems; linear data equation; localized approximation; scattering operator; source-type integral equation; Acoustic materials; Acoustic scattering; Convergence; Electromagnetic scattering; Frequency measurement; Integral equations; Inverse problems; Kernel; Robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2005 IEEE
Conference_Location
Washington, DC
Print_ISBN
0-7803-8883-6
Type
conf
DOI
10.1109/APS.2005.1551519
Filename
1551519
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