Title :
Study of UHF RFID signal propagation through complex media
Author :
Fletcher, Rich ; Marti, Uttara P. ; Redemske, Rich
Author_Institution :
Auto-ID Labs, MIT, Cambridge, MA
Abstract :
This paper shows how the propagation effects encountered in commercial RFID systems can all explained and predicted from fundamental electromagnetic propagation principles. The paper also shows that consideration of reflections and product dimensions are important for liquid and dielectric materials as well since much of the power loss occurs at the interface between air and the medium. The quantitative approach outlined in this paper can have an important impact on understanding the behavior of UHF RFID systems and optimizing performance
Keywords :
UHF radio propagation; dielectric materials; electromagnetic wave reflection; radiofrequency identification; UHF RFID signal propagation; complex media; dielectric materials; electromagnetic propagation principles; liquid; propagation effects; quantitative approach; reflections; Dielectric losses; Dielectric materials; Electromagnetic fields; Electromagnetic propagation; Electromagnetic reflection; Material properties; Propagation losses; Radiofrequency identification; UHF propagation; Water;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2005 IEEE
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-8883-6
DOI :
10.1109/APS.2005.1551670
