• DocumentCode
    444796
  • Title

    Cross-correlation and total efficiencies of two closely spaced sleeve dipole antennas

  • Author

    Hynes, Christopher G. ; Hui, Ping ; Van Wonterghem, Jani ; Michelson, David G.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., British Columbia Univ., Vancouver, BC
  • Volume
    1B
  • fYear
    2005
  • fDate
    2005
  • Firstpage
    799
  • Abstract
    This paper shows that for the special case of 3D uniform field incidence, with a cross-polarisation ratio (XPR) near unity, the cross-correlation coefficient and total efficiency are the measures for predicting diversity performance and can be estimated from measured 5-parameters. The results for the cross-correlation coefficients and efficiencies, as a function of dipole separation distance, are compared for two parallel side-by-side sleeve dipole antennas using three different methods: 3D anechoic chamber measurements, CST microwave studio numerical simulations, and S-parameter measurements. It is shown that the total efficiency is a critical diversity performance measure since the cross-correlation coefficients are very low due to pattern deformations and large efficiency degradations occur due to antenna coupling
  • Keywords
    S-parameters; anechoic chambers (electromagnetic); antenna radiation patterns; dipole antennas; diversity reception; polarisation; 3D anechoic chamber measurements; 3D uniform field incidence; S-parameter measurements; antenna coupling; cross-correlation coefficient; cross-polarisation ratio; dipole separation distance; diversity performance prediction; microwave studio numerical simulations; pattern deformations; sleeve dipole antennas; Antenna measurements; Autocorrelation; Dipole antennas; Equations; Frequency measurement; Polarization; Probability distribution; Q measurement; Scattering parameters; Solids;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2005 IEEE
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-8883-6
  • Type

    conf

  • DOI
    10.1109/APS.2005.1551685
  • Filename
    1551685