• DocumentCode
    444932
  • Title

    Low-angle reflectivity modeling of sea clutter using LS method

  • Author

    Feng, S. ; Chen, J. ; Tu, X.Y.

  • Author_Institution
    6Beijing Inst. of Technol., Beijing, China
  • Volume
    2B
  • fYear
    2005
  • fDate
    3-8 July 2005
  • Firstpage
    187
  • Abstract
    Radar sea clutter (SC) reflectivity is important for predicting the performance of radar engaged against a low-angle target at sea. Existing techniques to resolve the reflectivity estimate are mainly based on radar clutter theory and the LS approximation method. A more practical reflectivity model for SC is presented through data (Nathanson, F.E. et al., "Radar design principles: signal processing and the environment", McGraw-Hill, 1991). Throughout the reflectivity modeling, the idea of inductive reasoning is used. By using it, the functional relations between radar parameters and radar surface clutter backscattering are analyzed. In calculating the unknown parameters in the presented models, simplification of limit conditions are used so properly that the LS method can be employed. From the comparisons analysis, we can obtain that, generally, the presented SC model approximates that of Nathanson et al. better than others. Considering the accuracy and complexity for a more complex prediction of radar performance, the presented SC reflectivity model is preferable.
  • Keywords
    computational electromagnetics; least squares approximations; marine radar; radar clutter; radar theory; radiowave propagation; reflectivity; LS method; inductive reasoning; low-angle reflectivity modeling; radar clutter; radar parameters; radar sea clutter; radar surface clutter backscattering; reflectivity estimation; Backscatter; Least squares approximation; Predictive models; Process design; Radar clutter; Radar signal processing; Reflectivity; Sea surface; Signal design; Signal resolution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2005 IEEE
  • Print_ISBN
    0-7803-8883-6
  • Type

    conf

  • DOI
    10.1109/APS.2005.1551969
  • Filename
    1551969