Title :
Variations of the shorted patch antenna
Author :
Kan, H.K. ; Waterhouse, R.B. ; Lee, A.Y.J. ; Pavlickovski, D.
Author_Institution :
Univ. of the South Pacific, Suva, Fiji
Abstract :
Many techniques have been explored to reduce the overall size of a microstrip patch conductor in the low microwave frequency spectrum. These include using shorting pins and high dielectric constant material. Perforating or meshing the microstrip patch conductor has also been shown to give reasonable size reductions for a conventional patch antenna without compromising its radiation and impedance performance. We present a perforated shorted printed antenna which uses a shorting post as well as perforation slots that are embedded within the single layer printed antenna to reduce the surface area of the antenna. The antenna is small, with its overall dimensions of 0.13λ0×0.12λ0×0.07λ0 making its size compatible with most portable devices. We also present a variation of the perforated shorted patch that allows multifrequency operation. This new printed antenna consists of a stacked shorted patch geometry, where the lower frequency element is fed by a probe and the upper frequency radiator is electromagnetically coupled to the feed. The lower frequency radiator is a perforated shorted patch. The upper frequency radiator is located below the other element and is in the shape of a shorted ring.
Keywords :
antenna feeds; antenna radiation patterns; electric impedance; microstrip antennas; multifrequency antennas; antenna feed; dielectric constant; meshes; microstrip patch conductor; multifrequency antenna; perforated shorted patch antenna; perforated shorted printed antenna; perforation slots; radiation patterns; shorted ring; shorting pins; shorting post; size reduction; stacked shorted patch; Antenna feeds; Conducting materials; Dielectric materials; High-K gate dielectrics; Impedance measurement; Microstrip antennas; Microwave frequencies; Patch antennas; Pins; Slot antennas;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2005 IEEE
Print_ISBN :
0-7803-8883-6
DOI :
10.1109/APS.2005.1551982