DocumentCode
445064
Title
Hybrid S-parameters for analysis of mixed RF-digital circuits subject to external electromagnetic interference
Author
Bayram, Yakup ; Volakis, John L.
Author_Institution
ElectroScience Lab., Ohio State Univ., Columbus, OH, USA
Volume
3A
fYear
2005
fDate
3-8 July 2005
Firstpage
308
Abstract
We extend the port analysis technique to accommodate external plane wave coupling. In other words, we propose a frequency domain method which overcomes the CPU bottleneck of time domain techniques and concurrently yields increased accuracy as compared to MTLT. As part of this formalism we introduce additional hybrid S-parameters to establish a link between the existing board ports and external plane waves. Thus, we can handle both on-board and off-board EMI problems simultaneously. This approach can be easily integrated into circuit solvers such as HSPICE and Advanced Design System (ADS, Agilent Technologies). This is achieved by exporting new hybrid S-parameters. The method allows both time domain simulations via broadband network characterization and harmonic balance simulation of nonlinear RF components.
Keywords
S-parameters; UHF radio propagation; electromagnetic interference; mixed analogue-digital integrated circuits; radiofrequency integrated circuits; broadband network characterization; external plane wave coupling; frequency domain method; harmonic balance simulation; hybrid S-parameters; nonlinear RF components; off-board EMI problems; on-board EMI problems; port analysis technique; time domain simulations; Broadband communication; Central Processing Unit; Circuit simulation; Coupling circuits; Electromagnetic analysis; Electromagnetic interference; Frequency domain analysis; Integrated circuit technology; Integrated circuit yield; Scattering parameters;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2005 IEEE
Print_ISBN
0-7803-8883-6
Type
conf
DOI
10.1109/APS.2005.1552243
Filename
1552243
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