Title :
Hybrid S-parameters for analysis of mixed RF-digital circuits subject to external electromagnetic interference
Author :
Bayram, Yakup ; Volakis, John L.
Author_Institution :
ElectroScience Lab., Ohio State Univ., Columbus, OH, USA
Abstract :
We extend the port analysis technique to accommodate external plane wave coupling. In other words, we propose a frequency domain method which overcomes the CPU bottleneck of time domain techniques and concurrently yields increased accuracy as compared to MTLT. As part of this formalism we introduce additional hybrid S-parameters to establish a link between the existing board ports and external plane waves. Thus, we can handle both on-board and off-board EMI problems simultaneously. This approach can be easily integrated into circuit solvers such as HSPICE and Advanced Design System (ADS, Agilent Technologies). This is achieved by exporting new hybrid S-parameters. The method allows both time domain simulations via broadband network characterization and harmonic balance simulation of nonlinear RF components.
Keywords :
S-parameters; UHF radio propagation; electromagnetic interference; mixed analogue-digital integrated circuits; radiofrequency integrated circuits; broadband network characterization; external plane wave coupling; frequency domain method; harmonic balance simulation; hybrid S-parameters; nonlinear RF components; off-board EMI problems; on-board EMI problems; port analysis technique; time domain simulations; Broadband communication; Central Processing Unit; Circuit simulation; Coupling circuits; Electromagnetic analysis; Electromagnetic interference; Frequency domain analysis; Integrated circuit technology; Integrated circuit yield; Scattering parameters;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2005 IEEE
Print_ISBN :
0-7803-8883-6
DOI :
10.1109/APS.2005.1552243