DocumentCode :
445065
Title :
External EMI effects on a CMOS circuit in a cavity with an aperture
Author :
Kollman, Ronald D. ; Yang, H. Y. David
Author_Institution :
Haynes-Bent EM Consulting, Geneva, IL, USA
Volume :
3A
fYear :
2005
fDate :
3-8 July 2005
Firstpage :
312
Abstract :
This paper explores the disruption of a simple CMOS circuit in a rectangular cavity with a rectangular aperture. The CMOS circuit is fed by a microstrip line on the back face of the cavity opposite to the aperture. A cavity transfer function is determined that relates the E-field strength at the face of the cavity to a voltage at the input to the first gate of a 4-bit full adder circuit. Various waveshapes are analyzed using the cavity transfer function to get a modified wave at the input to the circuit and then determine the relative bit error rates of the various interference waveforms.
Keywords :
CMOS integrated circuits; adders; electromagnetic fields; electromagnetic interference; error statistics; microstrip lines; transfer functions; 4 bit; 4-bit full adder circuit; CMOS circuit; E-field strength; cavity transfer function; external EMI effects; interference waveforms; microstrip line feed; rectangular aperture; rectangular cavity; relative bit error rates; Adders; Apertures; Circuit simulation; Coupling circuits; Electromagnetic interference; Frequency; Microstrip; Resonance; Transfer functions; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2005 IEEE
Print_ISBN :
0-7803-8883-6
Type :
conf
DOI :
10.1109/APS.2005.1552244
Filename :
1552244
Link To Document :
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