DocumentCode
445068
Title
Causal parameter extractions by vector fitting for use in time-domain numerical modeling
Author
Luo, Shuiping ; Chen, Zhizhang
Author_Institution
Dept. of Electr. & Comput. Eng., Dalhousie Univ., Halifax, NS, Canada
Volume
3A
fYear
2005
fDate
3-8 July 2005
Firstpage
325
Abstract
In time-domain modeling techniques, such as the finite-difference time-domain method, a lumped parameter electronic device, such as a transistor, is often treated as a black box represented by its time-domain network parameters. The parameters of most electronic devices are, however, often given in the frequency domain and in a limited frequency range. Therefore, they need to be transformed into the corresponding time-domain parameters for inclusion in time-domain modeling. The vector fitting technique is a robust coefficient extraction technique that circumvents the normal ill-conditioning and unbalanced weighting problems occurring in a rational approximation or fitting process. We apply it to obtain frequency domain rational approximation functions of network parameters of a lumped parameter device and then convert them to the corresponding time-domain parameters. As a result, the time-domain parameters are not only causal but also exponential in time. Convolution can then be performed in a recursive fashion without the need to involve a complete past history of the time-domain data. In a long simulation, the CPU time saving factor can be hundreds and thousands of times.
Keywords
approximation theory; convolution; lumped parameter networks; network parameters; semiconductor device models; time-domain analysis; CPU time saving factor; causal parameter extraction; coefficient extraction technique; finite-difference time-domain method; frequency domain; lump electronic device; rational approximation functions; recursive convolution; time-domain network parameters; time-domain numerical modeling; transistor; vector fitting; Computational modeling; Equations; Finite difference methods; Frequency domain analysis; History; Noise measurement; Numerical models; Parameter estimation; Robustness; Time domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2005 IEEE
Print_ISBN
0-7803-8883-6
Type
conf
DOI
10.1109/APS.2005.1552248
Filename
1552248
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