• DocumentCode
    445085
  • Title

    Probability distributions of elevation and curvature of specular points at a statistically rough surface

  • Author

    Fuks, Iosif M.

  • Author_Institution
    LLC & NOAA/Environ. Technol. Lab., Zel Technol., Boulder, CO, USA
  • Volume
    3A
  • fYear
    2005
  • fDate
    3-8 July 2005
  • Firstpage
    437
  • Abstract
    When a random rough surface is illuminated by light or high-frequency radio waves, the specular reflected points make an ensemble, the statistical properties of which are of great interest not only for a general theory of scattering, but also for many practical applications, ranging from real-time monitoring of man-made surface roughness to sea roughness parameter measurements using sunlight flares at the surface. Apparently, M.S. Longuet-Higgins (see J. Opt. Soc. Am., vol.50, p.838-56, 1960) was the first to employ the theory of random functions for solving this problem. In particular, the explicit equations for the spatial density of extrema and saddle points were derived for Gaussian surfaces, and the fundamental relations between them were established. We use the general theory of random field excursions (Adler, R.J., 1981; Stoyan, D. et al., 1995) to obtain the statistical characteristics of specular points arising on random surfaces at normal incidence.
  • Keywords
    Gaussian distribution; electromagnetic wave reflection; electromagnetic wave scattering; light reflection; light scattering; random functions; rough surfaces; statistical analysis; Gaussian surfaces; high-frequency radio waves; light; probability distribution; random field excursions; random rough surface; specular points; statistical properties; statistically rough surface; sunlight flares; theory of random functions; Condition monitoring; Light scattering; Optimized production technology; Probability distribution; Rough surfaces; Scattering parameters; Sea measurements; Sea surface; Surface roughness; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2005 IEEE
  • Print_ISBN
    0-7803-8883-6
  • Type

    conf

  • DOI
    10.1109/APS.2005.1552279
  • Filename
    1552279