• DocumentCode
    445323
  • Title

    Vertical-structured Ni/n-GaN schottky diode with electroplating nickel substrate

  • Author

    Wang, Shui-Jinn ; Chang, Shu-Cheng ; Uang, Kai-Ming ; Liou, Bor-Wen

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan
  • Volume
    1
  • fYear
    2005
  • fDate
    22-22 June 2005
  • Firstpage
    59
  • Lastpage
    60
  • Abstract
    For the past decade, most of vertical device applications of GaN were processed by either wafer bonding or direct epitaxy on SiC or GaN wafer. However, the former usually suffers from large strain between GaN and bonding wafer because the high temperature and high pressure bonding process, and the later is not cost effective because of using SiC or GaN substrate. In this work, a novel vertical structure of Ni/n-GaN Schottky barrier diode (SBD) with metallic substrate employing nickel electroplating and laser lift-off (LLO) processes is proposed and its electrical characteristics is reported
  • Keywords
    Schottky diodes; electroplating; gallium compounds; laser beam etching; nickel; semiconductor technology; substrates; wide band gap semiconductors; Ni-GaN; Schottky barrier diode; laser lift-off processes; metallic substrate; nickel electroplating; vertical-structured Schottky diode; Bonding processes; Capacitive sensors; Epitaxial growth; Gallium nitride; Nickel; Schottky diodes; Silicon carbide; Substrates; Temperature; Wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference Digest, 2005. DRC '05. 63rd
  • Conference_Location
    Santa Barbara, CA
  • Print_ISBN
    0-7803-9040-7
  • Type

    conf

  • DOI
    10.1109/DRC.2005.1553054
  • Filename
    1553054