DocumentCode
445323
Title
Vertical-structured Ni/n-GaN schottky diode with electroplating nickel substrate
Author
Wang, Shui-Jinn ; Chang, Shu-Cheng ; Uang, Kai-Ming ; Liou, Bor-Wen
Author_Institution
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan
Volume
1
fYear
2005
fDate
22-22 June 2005
Firstpage
59
Lastpage
60
Abstract
For the past decade, most of vertical device applications of GaN were processed by either wafer bonding or direct epitaxy on SiC or GaN wafer. However, the former usually suffers from large strain between GaN and bonding wafer because the high temperature and high pressure bonding process, and the later is not cost effective because of using SiC or GaN substrate. In this work, a novel vertical structure of Ni/n-GaN Schottky barrier diode (SBD) with metallic substrate employing nickel electroplating and laser lift-off (LLO) processes is proposed and its electrical characteristics is reported
Keywords
Schottky diodes; electroplating; gallium compounds; laser beam etching; nickel; semiconductor technology; substrates; wide band gap semiconductors; Ni-GaN; Schottky barrier diode; laser lift-off processes; metallic substrate; nickel electroplating; vertical-structured Schottky diode; Bonding processes; Capacitive sensors; Epitaxial growth; Gallium nitride; Nickel; Schottky diodes; Silicon carbide; Substrates; Temperature; Wafer bonding;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference Digest, 2005. DRC '05. 63rd
Conference_Location
Santa Barbara, CA
Print_ISBN
0-7803-9040-7
Type
conf
DOI
10.1109/DRC.2005.1553054
Filename
1553054
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