DocumentCode
445362
Title
Optimal design and coulomb blockade suppressed leakage of carbon nanotube transistors
Author
Alam, Khairul ; Lake, Roger
Author_Institution
Dept. of Electr. Eng., California Univ., Riverside, CA
Volume
1
fYear
2005
fDate
22-22 June 2005
Firstpage
169
Lastpage
170
Abstract
We consider a 1.5 nm diameter (19,0) CNT for which zero-Schottky-barrier contacts have been demonstrated. The model device has a wrap-around gate, 2 nm ZrO2 dielectric, and the Fermi level of the metal contacts aligned with the conduction band of the source and drain. A number of different CNT lengths with various source/drain asymmetry are studied. A 40 nm length CNT with a 10 nm gate shows excellent performance as quantified below. We numerically calculate the gate delay (taus = C9VDD/ION), ON/OFF current ratio, and inverse subthreshold slope as a function of source to gate underlap L exS
Keywords
Coulomb blockade; Fermi level; Schottky diodes; carbon nanotubes; transistors; 1.5 nm; 10 nm; 40 nm; CNT; Coulomb blockade; Fermi level; ON/OFF current ratio; Schottky barrier contacts; carbon nanotube transistors; gate delay; metal contacts; source/drain asymmetry; wrap around gate; Analytical models; Capacitance; Carbon nanotubes; Charge carrier processes; Delay; Green function; Lakes; Leakage current; Poisson equations; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference Digest, 2005. DRC '05. 63rd
Conference_Location
Santa Barbara, CA
Print_ISBN
0-7803-9040-7
Type
conf
DOI
10.1109/DRC.2005.1553106
Filename
1553106
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