• DocumentCode
    445362
  • Title

    Optimal design and coulomb blockade suppressed leakage of carbon nanotube transistors

  • Author

    Alam, Khairul ; Lake, Roger

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Riverside, CA
  • Volume
    1
  • fYear
    2005
  • fDate
    22-22 June 2005
  • Firstpage
    169
  • Lastpage
    170
  • Abstract
    We consider a 1.5 nm diameter (19,0) CNT for which zero-Schottky-barrier contacts have been demonstrated. The model device has a wrap-around gate, 2 nm ZrO2 dielectric, and the Fermi level of the metal contacts aligned with the conduction band of the source and drain. A number of different CNT lengths with various source/drain asymmetry are studied. A 40 nm length CNT with a 10 nm gate shows excellent performance as quantified below. We numerically calculate the gate delay (taus = C9VDD/ION), ON/OFF current ratio, and inverse subthreshold slope as a function of source to gate underlap L exS
  • Keywords
    Coulomb blockade; Fermi level; Schottky diodes; carbon nanotubes; transistors; 1.5 nm; 10 nm; 40 nm; CNT; Coulomb blockade; Fermi level; ON/OFF current ratio; Schottky barrier contacts; carbon nanotube transistors; gate delay; metal contacts; source/drain asymmetry; wrap around gate; Analytical models; Capacitance; Carbon nanotubes; Charge carrier processes; Delay; Green function; Lakes; Leakage current; Poisson equations; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference Digest, 2005. DRC '05. 63rd
  • Conference_Location
    Santa Barbara, CA
  • Print_ISBN
    0-7803-9040-7
  • Type

    conf

  • DOI
    10.1109/DRC.2005.1553106
  • Filename
    1553106