• DocumentCode
    445368
  • Title

    High-performance silicon-germanium technology

  • Author

    Subbanna, Seshadri ; Freeman, Greg ; Koester, Steven ; Rim, Ken ; Joseph, Alvin ; Harame, David

  • Author_Institution
    IBM Syst. & Technol. Group, Hopewell Junction, NY
  • Volume
    1
  • fYear
    2005
  • fDate
    22-22 June 2005
  • Firstpage
    195
  • Lastpage
    196
  • Abstract
    This paper will focus on the various and ubiquitous uses of silicon-germanium (SiGe) in high-performance silicon-based semiconductor technology. SiGe can now qualify as a "mature" technology - it is almost 20 years since the first SiGe HBT work. It is 10 years since the qualification of SiGe as a manufacturable silicon technology in a high-volume silicon fabricator
  • Keywords
    Ge-Si alloys; semiconductor technology; high performance silicon based semiconductor technology; silicon germanium technology; CMOS process; CMOS technology; Germanium silicon alloys; HEMTs; Heterojunction bipolar transistors; Lithography; MODFETs; Microwave devices; Microwave frequencies; Silicon germanium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference Digest, 2005. DRC '05. 63rd
  • Conference_Location
    Santa Barbara, CA
  • Print_ISBN
    0-7803-9040-7
  • Type

    conf

  • DOI
    10.1109/DRC.2005.1553117
  • Filename
    1553117