DocumentCode
44545
Title
Fault-Tolerant Network Interfaces for Networks-on-Chip
Author
Fiorin, Leandro ; Sami, Mariagiovanna
Author_Institution
ALaRI, Univ. della Svizzera italiana, Lugano, Switzerland
Volume
11
Issue
1
fYear
2014
fDate
Jan.-Feb. 2014
Firstpage
16
Lastpage
29
Abstract
As the complexity of designs increases and technology scales down into the deep-submicron domain, the probability of malfunctions and failures in the networks-on-chip (NoCs) components increases. In this work, we focus on the study and evaluation of techniques for increasing reliability and resilience of network interfaces (NIs) within NoC-based multiprocessor system-on-chip architectures. NIs act as interfaces between intellectual property cores and the communication infrastructure; the faulty behavior of one of them could affect, therefore, the overall system. In this work, we propose a functional fault model for the NI components by evaluating their susceptibility to faults. We present a two-level fault-tolerant solution that can be employed for mitigating the effects of both permanent and temporary faults in the NI. Experimental simulations show that with a limited overhead, we can obtain an NI reliability comparable to the one obtainable by implementing the system by using standard triple modular redundancy techniques, while saving up to 48 percent in area, as well as obtaining a significant energy reduction.
Keywords
fault tolerance; logic circuits; microprocessor chips; network-on-chip; NoC; deep-submicron domain; fault-tolerant network interfaces; intellectual property cores; limited overhead; multiprocessor; networks-on-chip; reliability; system-on-chip architectures; triple modular redundancy; Circuit faults; Fault tolerance; Fault tolerant systems; Nickel; Registers; Routing; Table lookup; Networks-on-chip; fault tolerance; high-level error models; network interface; online fault detection; reliability;
fLanguage
English
Journal_Title
Dependable and Secure Computing, IEEE Transactions on
Publisher
ieee
ISSN
1545-5971
Type
jour
DOI
10.1109/TDSC.2013.28
Filename
6560056
Link To Document